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| 商品编号: |
DVD10441 |
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| 商品名稱： |
WaferPro Express 2016.04 HF2 x64 |
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| 碟片數量： |
1片 |
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| 銷售價格： |
150 |
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| 瀏覽次數： |
16287 |
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【轉載TXT文檔】 |
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| WaferPro Express 2016.04 HF2 x64 |
WaferPro Express 是一款新軟件平台，專門設計用於高效地執行自動化晶圓級測量。
WaferPro Express 幫助工程師降低晶圓級測量系統的複雜性，讓他們能夠快速設定和執行測試計畫，以便分析測量數據。WaferPro Express 能夠驅動是德科技儀器（和選定的非是德科技儀器）和探針台控制軟件（包含溫度控制），並提供出色的數據處理和顯示功能。
WaferPro Express 是我們與 Cascade Microtech 攜手合作的產物，也是晶圓級測量解決方案（WMS）的核心軟件。WMS 配置包含是德科技儀器和軟件、Cascade Microtech 晶圓探頭台、附件和軟件。利用新的 Keysight Verification Substrate（KVS），工程師可以快速驗證初始安裝完畢的 WMS 系統。每一套 KVS 已全面通過晶圓廠表徵，並配備標準器件，讓工程師能夠在完成射頻校準後使用 G-S-G 探頭來進行探測。WaferPro Express 2016.04 可以在初始系統驗證過程中測量 KVS，然後，通過比較測量數據和晶圓廠數據，來確認系統是否正常運作。
WaferPro Express 2016.04 進一步改善了與 Cascade Microtech Velox 2.0 探頭台控制軟件所獨有的集成度。通過 Cascade Microtech 與是德科技聯合開發的 WaferSync，WaferPro Express 和 Velox 2.0 可以整合在一起。WaferSync 支持完整的晶圓圖同步功能，以提供簡單、無誤差的軟件信息交換，包括晶圓對準、位點和裸片信息。
雖然以前版本添加了直接從 IC-CAP 導入例程的功能，不過 WaferPro Express 2016.04 更進一步增加了各種新器件類型、測試例程和示例等。現在還首次提供了 Python 示例。此外添加了新的 PEL 和 Python 教程。它們介紹了編程如何幫助用戶定製例程數據分析，或用客戶的測量算法代替內部儀器驅動程序。
WaferPro Express 2016.04 現在能夠運行部分測試計畫。當用戶在整個晶圓運行完畢後想要重複某些測量時，這個特性尤其有用。
WaferPro Express 2016.04 |
Keysight Technologies, Inc. introduced the latest release of its powerful WaferPro Express 2016.04 software is a new software platform specifically designed to efficiently execute automated wafer-level measurements.
WaferPro Express helps to reduce wafer-level measurement system complexity and simplifies the everyday task of setting up and executing test plans to analyze measured data. WaferPro Express drives Keysight (and select non-Keysight) instruments as well as prober control software (including temperature control), and provides powerful data handling and display capabilities.
WaferPro Express is also a key component of Wafer-level Measurement Solutions (WMS) from Keysight Technologies and Cascade Microtech. WMS include Keysight instruments and software as well as Cascade Microtech wafer probers, accessories and software. Verification of newly installed WMS systems is performed using the new Keysight Verification Substrate (KVS). Each KVS is fully characterized at the factory and features standard devices that engineers can probe with G-S-G probes after RF calibration. WaferPro Express 2016.04 measures the KVS during initial system verification procedure. Then, by comparing measured and factory data, it certifies the system’s proper operation.
WaferPro Express 2016.04 further improves the exclusive integration with Cascade Microtech’s Velox 2.0 prober control software. WaferPro Express and Velox 2.0 are integrated through Cascade Microtech’s WaferSync, a jointly developed two-way communication link. The link allows for complete wafer map synchronization, which enables easy and error-free information exchange between the software, including wafer alignment, sites and die information.
While previous releases added the ability to import routines directly from IC-CAP, WaferPro Express 2016.04 adds a variety of new device types, test routines and examples. For the first time, Python examples are now provided. In addition, new PEL and Python tutorials have been added. These show how programming can help users to customize routine data analysis or replace internal instrument drivers with customer measurement algorithms.
WaferPro Express 2016.04 now provides the ability to run partial test plans. This feature is useful when users want to repeat certain measurements after a full wafer run.
Key features of WaferPro Express 2016.04
- WaferPro Express is now the official software platform for the Advanced Low-Frequency Noise Analyzer (A-LFNA). A-LFNA is a high-performance noise analyzer designed to make accurate and repeatable low frequency noise measurements.
- New factory device types, test algorithms and examples
- New PEL and Python tutorials
- Support for running partial test plans
- Enhanced link to Cascade Microtech Velox 2.x (UI improvements and fixes)
- Up to 3X speed improvements in B1500A, E5270A and other drivers
Starting with Version 2016.04, WaferPro Express is the official software platform for the Advanced Low frequency Noise Analyzer (A-LFNA), a high-performance noise analyzer designed to make accurate and repeatable low frequency noise measurements.
Product: WaferPro Express
Version: 2016.04 HF1
Supported Architectures: 64bit
Website Home Page : http://www.keysight.com
Language: english
System Requirements: PC
Supported Operating Systems: Windows 7 Enterprise (SP1)
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